Challenge
  • Develop standard design template in order to reduce costs to meet growing market demand while still remaining flexible to meet each customer’s unique needs
  • Illuminate photovoltaic under test with a simulated solar spectrum to accommodate various product sizes and manufacturing processes while meeting industry-accepted standards
  • Design and integrate data acquisition and photovoltaic electronic load circuitry to support very short light source pulse widths and fast test times
  • Develop software and material handling flexibility to support the data analysing, classifying, and sorting of various product types and sizes
  • Material handling tooling to support extremely brittle, thin crystalline material

 

Solution

  • A complete automated solution for the testing and sorting of photovoltaic cells & panels of a variety of types and sizes
  • Support for either continuous or pulsed light source technologies with required sun intensity and image area uniformity
  • High-end, high-speed data acquisition and computer-controlled test circuitry to sweep and capture the product’s Current vs. Voltage (I-V) characteristic
  • Ability to normalize for temperature and/or control test platen temperature for consistency of results
  • PC-based testing in a Windows NT environment with advanced user configuration menus, system diagnostics, shift report generation, and test data analysing, archiving, & exporting capabilities

 

Technologies Integrated
  • ATS Test Systems Customized Visual C++ Test Executive
  • National Instruments high-speed, high-accuracy data acquisition sized for required sample rates of photovoltaic current, voltage, and temperature
  • Agilent Programmable Power Supply for voltage biasing of photovoltaic to compensate for short circuit losses
  • Computer-controlled, fast-response FET electronic load to sweep photovoltaic I-V characteristic
  • Integration with either continuous or pulsed light sources, sized for photovoltaic image area
  • ATS Test Systems custom tooling and fixturing with optional temperature-controlled test platen
  • ATS SuperbotTM for product material handling to identified cell classification bins
  • ATS Test Systems urethane solar cell carriers

 

Performance Achieved
  • Demonstrated Gauge Repeatability & Reproducibility < 10%
  • Fast test times support overall process throughput of < 3 seconds per part
  • Configurable test ranges and pass/fail criteria for the following parameters (system instrumentation is selected to match product specifications):
    • Complete I-V Curve
    • Open Circuit Voltage
    • Short Circuit Current
    • Maximum Power
    • Current & Voltage @ Maximum Power
    • Short Circuit Current Density
    • Current @ Fixed Voltage Level
    • Fill Factor
    • Efficiency
    • Series Resistance
    • Parallel Resistance
    • Temperature

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